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![Cover for Nicolici, Nicola (Mcmaster University, Hamilton, Ontario, Canada) · Power-constrained Testing of Vlsi Circuits: a Guide to the Ieee 1149.4 Test Standard - Frontiers in Electronic Testing (Paperback Book) [Softcover Reprint of the Original 1st Ed. 2003 edition] (2010)](https://imusic.b-cdn.net/images/item/original/155/9781441953155.jpg?nicolici-nicola-mcmaster-university-hamilton-ontario-canada-2010-power-constrained-testing-of-vlsi-circuits-a-guide-to-the-ieee-1149-4-test-standard-frontiers-in-electronic-testing-paperback-book&class=scaled&v=1624849564)