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Monte Carlo Modeling for Electron Microscopy and Microanalysis - Oxford Series in Optical and Imaging Sciences Joy, David C. (Director, Electron Microscope Facility, Director, Electron Microscope Facility, University of Tennessee)
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Monte Carlo Modeling for Electron Microscopy and Microanalysis - Oxford Series in Optical and Imaging Sciences
Joy, David C. (Director, Electron Microscope Facility, Director, Electron Microscope Facility, University of Tennessee)
This book is a practical guide to the use of Monte Carlo simulation techniques for the study of electron solid interactions in the electron microscope. Programs, optimized for use on personal computers, are developed to deal with typical applications including secondary, and back- scattered, electron imaging. EBIC imaging of semiconductors and X-ray microanalysis.
224 pages, line figures, tables
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 13 de abril de 1995 |
| ISBN13 | 9780195088748 |
| Editores | Oxford University Press Inc |
| Páginas | 224 |
| Dimensiones | 234 × 156 × 14 mm · 498 g |
| Lengua | Inglés |
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