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Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation 1.º edición
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Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation
Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the
368 pages
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 30 de junio de 2020 |
| ISBN13 | 9780367446802 |
| Editores | Taylor & Francis Ltd |
| Páginas | 368 |
| Dimensiones | 150 × 220 × 10 mm · 680 g |
| Lengua | Inglés |
| Editor | Fitzpatrick, M.E. |
| Editor | Lodini, Alain |
