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Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation Alain Lodini 1.º edición
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Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation
Alain Lodini
Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the
320 pages, 208 line figures, 23 half tones and 15 tables
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 6 de febrero de 2003 |
| ISBN13 | 9780415303972 |
| Editores | Taylor & Francis Ltd |
| Páginas | 366 |
| Dimensiones | 152 × 229 × 22 mm · 885 g |
| Lengua | Inglés |
| Editor | Fitzpatrick, M.E. |
| Editor | Lodini, Alain |
