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Applied Charged Particle Optics: Part II - Advances in Imaging and Electron Physics
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Applied Charged Particle Optics: Part II - Advances in Imaging and Electron Physics
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Pendiente de lanzamiento | 1 de agosto de 2026 |
| ISBN13 | 9780443471124 |
| Editores | Elsevier Science Publishing Co Inc |
| Páginas | 258 |
| Dimensiones | 150 × 220 × 20 mm · 549 g (Peso (estimado)) |
| Editor de series | Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) |
| Editor de series | Hytch, Martin (Senior Scientist, French National Centre for Research (CNRS), Toulouse, France) |
