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Topics in Electron Diffraction and Microscopy of Materials - Series in Microscopy in Materials Science Peter. B Hirsch 1.º edición
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Topics in Electron Diffraction and Microscopy of Materials - Series in Microscopy in Materials Science
Peter. B Hirsch
Offers an overview of applications for selected electron microscope techniques that have become widespread in their use for furthering our understanding of how materials behave. This work discusses topics including weak-beam techniques for problem solving, defect structures and dislocation interactions, and atomic level imaging applications.
196 pages, 37 halftones, 40 line illustrations, index
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 1999 |
| ISBN13 | 9780750305389 |
| Editores | Taylor & Francis Ltd |
| Páginas | 208 |
| Dimensiones | 241 × 162 × 18 mm · 432 g |
| Lengua | Inglés |
| Editor | Hirsch, Peter. B (University Of Oxford, England, UK) |
