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Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing Benoit Nadeau-dostie 2000 edition
Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing
Benoit Nadeau-dostie
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels.
239 pages, biography