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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing Jitendra B. Khare 1996 edition
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing
Jitendra B. Khare
Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.
150 pages, biography