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AI, Machine Learning and Deep Learning: A Security Perspective Hu, Fei (The University of Alabama, Electrical and Computer Engineering, Tuscaloosa, USA)
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AI, Machine Learning and Deep Learning: A Security Perspective
Hu, Fei (The University of Alabama, Electrical and Computer Engineering, Tuscaloosa, USA)
Today AI and Machine/Deep Learning have become the hottest areas in the information technology. This book aims to provide a complete picture on the challenges and solutions to the security issues in various applications. It explains how different attacks can occur in advanced AI tools and the challenges of overcoming those attacks.
336 pages, 47 Tables, black and white; 131 Line drawings, black and white; 5 Halftones, black and wh
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 5 de junio de 2023 |
| ISBN13 | 9781032034041 |
| Editores | Taylor & Francis Ltd |
| Páginas | 334 |
| Dimensiones | 261 × 184 × 24 mm · 786 g |
| Lengua | Inglés |
| Editor | Hei, Xiali (University of Louisiana at Lafayette, USA) |
| Editor | Hu, Fei (The University of Alabama, Electrical and Computer Engineering, Tuscaloosa, USA) |
