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Statistical Analysis of Spatial and Spatio-Temporal Point Patterns - Chapman & Hall / CRC Monographs on Statistics and Applied Probability Peter J. Diggle 3.º edición
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Statistical Analysis of Spatial and Spatio-Temporal Point Patterns - Chapman & Hall / CRC Monographs on Statistics and Applied Probability
Peter J. Diggle
Retaining all the material from the second edition and adding substantial new material, this third edition presents models and statistical methods for analyzing spatially referenced point process data. Reflected in the title, this edition now covers spatio-temporal point patterns. It also incorporates the use of R through several packages dedica
300 pages, 117 Illustrations, black and white
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 21 de enero de 2023 |
| ISBN13 | 9781032477473 |
| Editores | Taylor & Francis Ltd |
| Páginas | 300 |
| Dimensiones | 150 × 220 × 10 mm · 540 g |
