Recomienda este artículo a tus amigos:
Measurement Error: Models, Methods, and Applications - Chapman & Hall / CRC Interdisciplinary Statistics Buonaccorsi, John P. (University of Massachusetts, Amherst, Massachusetts, USA)
Precio
Mex$ 1.339
sin IVA
Pedido desde almacén remoto
Entrega prevista 19 de ago. - 4 de sep.
Recibe notificaciones sobre nuevos lanzamientos de Buonaccorsi, John P. (University of Massachusetts, Amherst, Massachusetts, USA)
Nuestros clientes opinan:
Añadir a tu lista de deseos de iMusic
También disponible como:
Measurement Error: Models, Methods, and Applications - Chapman & Hall / CRC Interdisciplinary Statistics
Buonaccorsi, John P. (University of Massachusetts, Amherst, Massachusetts, USA)
This work describes the impacts of measurement errors on naive analyses that ignore them and presents ways to correct for them across a variety of statistical models, from simple one-sample problems and misclassification in categorical models to regression models to more complex mixed and time series models. It covers correction methods based on
464 pages, 30 Illustrations, black and white
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 21 de enero de 2023 |
| ISBN13 | 9781032477688 |
| Editores | Taylor & Francis Ltd |
| Páginas | 464 |
| Dimensiones | 150 × 220 × 10 mm · 453 g |
| Editor de series | Keiding, Niels (University of Copenhagen, Denmark) |
| Editor de series | Morgan, Byron J.T. (University of Kent, UK) |
| Editor de series | Speed, Terry (University of California, Berkeley, USA) |
| Editor de series | Van der Heijden, Peter (Utrecht University, The Netherlands) |
