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Advances in X-Ray Analysis: Volume 10 John B. Newkirk Softcover reprint of the original 1st ed. 1967 edition
Advances in X-Ray Analysis: Volume 10
John B. Newkirk
The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses sions, Professor R. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.
558 pages, 220 black & white illustrations, biography
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 12 de junio de 2012 |
| ISBN13 | 9781468478372 |
| Editores | Springer-Verlag New York Inc. |
| Páginas | 558 |
| Dimensiones | 178 × 254 × 29 mm · 984 g |
| Lengua | Inglés |
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