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Radiation-induced Soft Error: A Chip-level Modeling - Foundations and Trends (R) in Electronic Design Automation Norbert Seifert
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Radiation-induced Soft Error: A Chip-level Modeling - Foundations and Trends (R) in Electronic Design Automation
Norbert Seifert
A simulation-based methodology of chip-level radiation-induced soft error rates that is fast and reasonably accurate is crucial to the reliability and success of a final product. This book summarises selected publications that are deemed relevant by the author to enable a truly chip-level radiation-induced soft error rate estimation methodology.
136 pages
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 27 de noviembre de 2010 |
| ISBN13 | 9781601983947 |
| Editores | now publishers Inc |
| Páginas | 136 |
| Dimensiones | 157 × 234 × 8 mm · 199 g |
| Lengua | Inglés |
