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ISTFA 2014, Proceedings from the 40th International Symposium for Testing and Failure Analysis ASM International
ISTFA 2014, Proceedings from the 40th International Symposium for Testing and Failure Analysis
ASM International
Features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, "Exploring the Many Facets of Failure Analysis".
500 pages
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 30 de abril de 2015 |
| ISBN13 | 9781627080743 |
| Editores | A S M International |
| Páginas | 500 |
| Dimensiones | 150 × 220 × 10 mm · 749 g (Peso (estimado)) |
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