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ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis ASM International
ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis
ASM International
The International Symposium for Testing and Failure Analysis is the premier event for scientists and engineers who work to evaluate failures and improve the performance and reliability of semiconductor devices and processing techniques. This ISTFA 2020 publication includes the papers that were accepted for the planned 2020 conference.
396 pages
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 30 de octubre de 2020 |
| ISBN13 | 9781627083331 |
| Editores | A S M International |
| Páginas | 396 |
| Dimensiones | 150 × 220 × 10 mm · 970 g |
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