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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs Alexandra Zimpeck 2021 edition
Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
Alexandra Zimpeck
transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells.
131 pages, 50 Tables, color; 86 Illustrations, color; 3 Illustrations, black and white; XIII, 131 p.
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 11 de marzo de 2022 |
| ISBN13 | 9783030683702 |
| Editores | Springer Nature Switzerland AG |
| Páginas | 131 |
| Dimensiones | 150 × 220 × 10 mm · 238 g |
| Lengua | Alemán |