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Recent Advances in Microelectronics Reliability: Contributions from the European ECSEL JU project iRel40
Recent Advances in Microelectronics Reliability: Contributions from the European ECSEL JU project iRel40
This book describes the latest progress in reliability analysis of microelectronic products. More importantly, this book tries to present methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of electronic devices.
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 14 de julio de 2025 |
| ISBN13 | 9783031593635 |
| Editores | Springer International Publishing AG |
| Páginas | 403 |
| Dimensiones | 150 × 220 × 10 mm · 633 g |
| Lengua | Alemán |
| Editor | Pressel, Klaus |
| Editor | Soyturk, Mujdat |
| Editor | Van Driel, Willem Dirk |