Recomienda este artículo a tus amigos:
Helium Ion Microscopy - NanoScience and Technology Softcover reprint of the original 1st ed. 2016 edition
Helium Ion Microscopy - NanoScience and Technology
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field.
526 pages, 100 Tables, color; 204 Illustrations, color; 116 Illustrations, black and white; XXIII, 5
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 16 de junio de 2018 |
| ISBN13 | 9783319824734 |
| Editores | Springer International Publishing AG |
| Páginas | 526 |
| Dimensiones | 156 × 234 × 32 mm · 814 g |
| Lengua | Alemán |
| Editor | Golzhauser, Armin |
| Editor | Hlawacek, Gregor |