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Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms - Springer Theses Jozef Vesely Softcover reprint of the original 1st ed. 2017 edition
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Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms - Springer Theses
Jozef Vesely
This thesis addresses elementary dislocation processes occurring in single-crystalline alloys based on Fe-Al, and investigates correspondences between dislocation distribution inside crystals characterized by transmission electron microscopy (TEM) and surface patterns observed using atomic force microscopy (AFM).
100 pages, 21 Illustrations, color; 65 Illustrations, black and white; XIV, 100 p. 86 illus., 21 ill
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 7 de julio de 2018 |
| ISBN13 | 9783319839103 |
| Editores | Springer International Publishing AG |
| Páginas | 100 |
| Dimensiones | 150 × 220 × 10 mm · 172 g |