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Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals: A Scanning Probe Microscopy Approach - Springer Theses Nicholas D. Kay Softcover reprint of the original 1st ed. 2018 edition
Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals: A Scanning Probe Microscopy Approach - Springer Theses
Nicholas D. Kay
This thesis introduces a unique approach of applying atomic force microscopy to study the nanoelectromechanical properties of 2D materials, providing high-resolution computer-generated imagery (CGI) and diagrams to aid readers’ understanding and visualization.
122 pages, 14 Tables, color; 14 Illustrations, color; 53 Illustrations, black and white; XXI, 122 p.
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 4 de septiembre de 2018 |
| ISBN13 | 9783319888989 |
| Editores | Springer International Publishing AG |
| Páginas | 122 |
| Dimensiones | 150 × 220 × 10 mm · 230 g |
| Lengua | Alemán |