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Applied Scanning Probe Methods IX: Characterization - NanoScience and Technology 2008 edition
Applied Scanning Probe Methods IX: Characterization - NanoScience and Technology
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications.
447 pages, 189 black & white illustrations, 27 colour illustrations, 25 black & white tables
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 11 de enero de 2008 |
| ISBN13 | 9783540740827 |
| Editores | Springer-Verlag Berlin and Heidelberg Gm |
| Páginas | 387 |
| Dimensiones | 165 × 243 × 21 mm · 725 g |
| Lengua | Alemán |
| Editor | Bhushan, Bharat |
| Editor | Fuchs, Harald |
| Editor | Tomitori, Masahiko |