Optical Properties of Znte Thin Films Deposited Using Silar Method - Jignesh Rathod - Libros - LAP LAMBERT Academic Publishing - 9783659273858 - 11 de marzo de 2014
En caso de que portada y título no coincidan, el título será el correcto

Optical Properties of Znte Thin Films Deposited Using Silar Method

Precio
Mex$ 674
sin IVA

Pedido desde almacén remoto

Entrega prevista 6 - 16 de jul.
Añadir a tu lista de deseos de iMusic

This book starts with the theoretical back ground of optical absorption in semiconductors. Various optical parameters like the absorption (A), transmission(T), extinction coefficient (K), refractive index (n),optical energy gap (Eg), etc. were calculated with detailed analysis of UV-VIS-IR spectra for ZnTe thin films deposited by successive ionic layer absorption and reaction (SILAR) method at various thickness and annealing temperature. The results are analyzed and discussed in detail in this book.

Medios de comunicación Libros     Paperback Book   (Libro con tapa blanda y lomo encolado)
Publicado 11 de marzo de 2014
ISBN13 9783659273858
Editores LAP LAMBERT Academic Publishing
Páginas 64
Dimensiones 150 × 4 × 226 mm   ·   113 g
Lengua Alemán  

Mas por Jignesh Rathod

Mostrar todo