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Resonant X-Ray Scattering in Correlated Systems - Springer Tracts in Modern Physics Softcover reprint of the original 1st ed. 2017 edition
Resonant X-Ray Scattering in Correlated Systems - Springer Tracts in Modern Physics
The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides.
241 pages, 25 Illustrations, color; 126 Illustrations, black and white; VII, 241 p. 151 illus., 25 i
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 7 de julio de 2018 |
| ISBN13 | 9783662571224 |
| Editores | Springer-Verlag Berlin and Heidelberg Gm |
| Páginas | 241 |
| Dimensiones | 150 × 220 × 10 mm · 388 g |
| Lengua | Alemán |
| Editor | Ishihara, Sumio |
| Editor | Murakami, Youichi |