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Built-in Self-test of Global Routing Resources in Fpgas: Bist for Xilinx Virtex-4 Fpgas Jia Yao
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Built-in Self-test of Global Routing Resources in Fpgas: Bist for Xilinx Virtex-4 Fpgas
Jia Yao
It is important to test programmable routing resources in Field Programmable Gate Arrays (FPGAs) because they take up the largest portion of configuration memory bits. In Virtex-4 FPGAs, routing resources account for over 80% of the configuration memory. Built-In Self-Test (BIST) is adopted to test the routing resources in FPGAs and overcomes issues residing in previously developed test approaches. Analysis and evaluations of developed BIST algorithm and configurations are provided.
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 18 de enero de 2011 |
| ISBN13 | 9783843374958 |
| Editores | LAP LAMBERT Academic Publishing |
| Páginas | 88 |
| Dimensiones | 225 × 5 × 150 mm · 149 g |
| Lengua | Alemán |
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