Characterization of Smart Pzt and Admittance Signatures for Shm: Pzt for Structural Health Monitoring - Venu Gopal Madhav Annamdas - Libros - LAP LAMBERT Academic Publishing - 9783845417523 - 22 de julio de 2011
En caso de que portada y título no coincidan, el título será el correcto

Characterization of Smart Pzt and Admittance Signatures for Shm: Pzt for Structural Health Monitoring

Precio
Mex$ 1.250
sin IVA

Pedido desde almacén remoto

Entrega prevista 18 - 30 de sep.
Recibe notificaciones sobre nuevos lanzamientos de Venu Gopal Madhav Annamdas
Añadir a tu lista de deseos de iMusic

Aún no valorado

Engineering structures can be classified into two categories based on their stiffness, those which are more stiff than and those which are less stiff than the PZT material. Surface bonded PZT transducers are more efficient when they are stiffer than the host structure, and embedded transducers are more efficient when they are less stiff than the host structure. Both types of PZT transducers are important in the EMI based NDE of the two categories of engineering structures. However, surface bonded PZT transducers have seen more prominent applications in the recent past in SHM. This research developed both surface bonded and embedded PZT- structure interaction models for SHM of existing and future ACM structures. Furthermore PZT material properties are easily influenced by external factors such as the atmosphere and the presence of electric and magnetic fields. Hence, this research made a step by step analysis to understand the PZT properties prior to their usage in the interaction models. Thus, this book presented the characterization of the PZT properties. Last but not least, this research also studied the influencing factors of EM admittance Signatures.

Medios de comunicación Libros     Paperback Book   (Libro con tapa blanda y lomo encolado)
Publicado 22 de julio de 2011
ISBN13 9783845417523
Editores LAP LAMBERT Academic Publishing
Páginas 260
Dimensiones 150 × 15 × 226 mm   ·   405 g
Lengua Alemán