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Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Springer Tracts in Advanced Robotics Hui Xie 2012 edition
Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Springer Tracts in Advanced Robotics
Hui Xie
The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.
344 pages, biography
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 26 de noviembre de 2014 |
| ISBN13 | 9783642445019 |
| Editores | Springer-Verlag Berlin and Heidelberg Gm |
| Páginas | 344 |
| Dimensiones | 155 × 235 × 19 mm · 503 g |
| Lengua | Inglés |